All the benefits of VIDEO LEED systems plus Automatic Image & Data Acquisition
Suitable for LEED, RHEED and other applications using a video signal
Real time measurement of I (V) - and I (t) - curves
Measurement of profiles in any direction
Comprehensive image processing
Easy to operate by menu and mouse control
Can be used with any LEED optics and RHEED gun
A/D-D/A Converter-Board PCI
Type: BMC- PCI-BASE 300 High speed
Resolution: A/D 16 BIT min. : D/A 16 BIT min.
Speed: 333 kHz 2d2"
Voltage: A/D range +/- 1, 2, 5, 10V and 0-5V: D/A range +/- 5, 10V
Input: A/D 16, D/A 2
Digital-I/0 implement
TTL Input: 16, TTL Output: 16
Energy steps: at energy ramp 0-3000 eV in steps of 0,04 eV.
FIFO: 4 kByte
Rel. accuracy in the measuring ranges: 0,0015 %.
Converter rate: 10µs.
Capture-Board AGP:
Type: ASUS AGP-V6800 Deluxe
Speed: ASUS LIVE Real-time 30 fps 704 x 480 video capture
Driver CD: Windows 98, Windows, Microsoft DirectX driver, GART driver, interactive products tutorials
Powered by GeForce256 DDR GPU
300MHz video memory
RAM: 32 MB DDR Video Memory
Remark: High speed 30 fps by Windows 98 only realize
Image: 4:3 (4 horizontal : 3 vertical)
Solution: 8 BIT (256 gray scale) with full pixels image 4:3
Transmission: more than 2 Mbytes/sec. (optimal Computer configuration)
Video in: 1 x SVHS non compression, 1 x Cinch non-compression
Video out: 1 x SVHS, 1 x Cinch
VGA: 1 x SUB-D Monitor
Peak fill rate of 480 million bilinear filtered, multi-textured pixels and more than 3.8 gigatexels per second. Up to 15 million triangles per second at peak rates. 32 Bit Z and stencil buffer.
Computer
Software:Windows® 98/2000/NT
compatible software, 32 bit
Real-time measurement of intensities of spots as function of energy i.e. I(V)-curves,
I(t) measurements, R-factor analysis, of time oscillations, temperature and
other parameters. Data analysis can be carried out either directly or from
saved images and profile measurement (line scan). The I/V spectra can be either
normalized with the beam current or not.
8 windows for intensity measurement (free selectable in position and size), 18 spots tracking
Real-time integration and imaging
On-line (on/off) background subtraction
Signal averaging
Automatic maximum location
of single spots Automatic window tracking (I/V-curves)
Profiles (line scans) in any direction or dimension
Measurement of up to 8 external parameters (i.e. primary current, temperature, pressure, energy)
Gray- and colour-look-up-table
R-factor-comparison (Pendry and R2)
Software video recorder for subsequent analysis of I (t) measurements
Control of LEED-, RHEED-, other power supplies and control of experiments
Easy to use by mouse or menu
Data processing, addition, subtraction, multiplication, division -of numbers and spectra-, differentiation, integration and background subtraction, FWHM measurement
Data output in standard
ASCII / Tiff / Bitmap format and on HP laser printer and HP video printer
CCD-Camera KAM 02
High Performance, low-light near-infrared CCD-camera, with lenses, manual and automatic gain control, including power supply
Image area is 6.4*4.8 mm
795x596 Pixels, 48dB S/N-ratio,
Resolution 600 lines (horizontal)
Sensitivity (min detectable signal at sensor): 0.02 Lx.
Compatible with the
RHEED screen (phosphor coated glass screen)
Options
VCR, amplifier, Peltier-cooled CCD-camera and video printer
VIDEO LEED (AIDA-PC) graphical user interface during a line scan through the LEED pattern of a C(2 x 2) O / Ni (100) superstructure.
The intensity versus location curve represents the measured profiles of the diffraction spots along the vertical line through the center of the diffraction pattern.
The Applications Notes also contain examples of AIDA PC display capability.
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C4
Scientific Systems
754 Leona Ln Mountain View, California 94040 Phone: (650) 961-6620 Fax: (650) 961-8591 support@c4scientific.com |