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UFO-SPECS XPS UHV System
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XPS
System for Synchrotron Applications
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XPS-System
with Monochromator
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High-Resolution
XPS System
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The Universal
Fotoelectron Omni SPECtrometer System (UFO-SPECS)
is a modular UHV-system which offers multi-technique capability incorporating
the following range of facilities for surface analysis: Small Spot Monochromatic
XPS, STM/AFM, UPS, ISS, Auger Electron Spectroscopy (AES), EELS, TPD, SEM, SAM,
LEED, PEEM, LEEM, SIMS and SNMS Mass Spectroscopy and Sample Preparation.
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Complete
Surface Analysis Nano-Laboratory
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Multi-Chamber XPS System
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XPS-System
with Preparation Chamber
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Nondestructive characterisation of advanced materials with the following features:
- Highest ESCA performance
and energy resoultion
- VT-AFM/STM with atomic resolution
- Monochromatic X-ray source with high count rates
- UHV Radial Sample Distribution System
- Sample Preparation and Materials Deposition Chambers
- Multi-Technique Capabilities
- Heatable/Coolable Sample Manipulator
- UHV system with excellent basic vacuum
- VT-AFM/STM with atomic resolution
- Monochromatic X-ray source with high count rates
- UHV Radial Sample Distribution System
- Sample Preparation and Materials Deposition Chambers
- Multi-Technique Capabilities
- Heatable/Coolable Sample Manipulator
- UHV system with excellent basic vacuum
UFO-SPECS Systems are build with highest Performance Components from VG-SCIENTA:
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VG-Scienta
R3000 Electron Spectrometer
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VG-SCIENTA
MX 650 X-ray Monochromator
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VG-Scienta
R4000 Electron Spectrometer
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