The CreaTec beam flux monitor BAF is used for the precise measurement of beam equivalent pressures of different molecular beams in an MBE system. A Bayard-Alpert type flux gauge is mounted onto a movable position system, that allows to move he monitor from its protected intermediate position into a measurement position in between the molecular beam (typically near the substrate or in place of the substrate if it can be retracted).

Highly precise measurement electronics guarantee a very stable detection of the investigated molecular beam intensity. With a standard computer interface, the control of the beam flux measurement by computer is very convenient.

OPTION:
Quartz-crystal monitor instead of Bayard-Alpert ionisation gauge.