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New femto-Science,
LEED - AES with Delayline Detector, Microchannel Plates, mini-LEED, from OCI
Microengineering
- OCI: World Wide Market Leader of LEED-AES Spectrometers
- NANO-SCALE MEASUREMENTS OF SURFACE PERIODIC STRUCTURES WITH FEMPTO-AMPERE ELECTRON PROBE
- Fully-Digital Fempto-LEED for Electron Diffraction on Insulating Single Crystals with Delay Line Detector Large Coherence Width
- Auger Data Acquisition Software with Real Time Signal v.s Energy Analysis, Auger Depth Profiling
- LEED Image Analysis System with highest Resolution Low Light CCD Camera, Frame Grabber, and Ambient Light Cover
- Digital LEED-AES Controllers, Digital Raster Scan