The UHV
System with AFM/STM is a modular UHV-system which offers multi-technique
capability incorporating the following range of facilities for surface analysis:
Small Spot Monochromatic XPS, STM/AFM, UPS, ISS, Auger Electron Spectroscopy
(AES), LEED, Mass Spectroscopy and Sample Preparation.

Picture courtesy of RHK Technology
Nondestructive characterisation of advanced materials with the following features:
- Highest ESCA performance and energy resoultion
- VT-AFM/STM with atomic resolution
- Monochromatic X-ray source with high count rates
- Multi-Technique Capabilities
- Heatable/Coolable Sample Manipulator
- UHV system with excellent basic vacuum
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UHV AFM Image
of NaCl (100) on Mica.
Picture courtesy of RHK Technology |
UHV MFM image
of Hard Drive Test Platter
Picture courtesy of RHK Technology |