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754 Leona Ln
Mountain View, CA 94040, USA
Tel: -1-650-961-6620
sales@c4scientific.com

 


Scientific
 
 
  Components & Systems   A to Z:

E-mail or Call: 1-650-961-6620 Request Quote (RFQ) Contact C4

 
AFM Atomic Force Microscopy
Atomic Layer Deposition
ALD Atomic Layer Deposition
AMM Atomic-Molecular Manipulation
BioJet
BioJet BioTechnology
CL CathodoLuminescence
CBE Chemical Beam Epitaxy
KAMINA Chemical Gas Detector Sensor
CVD Chemical Vapor Deposition
Ion Gun Depth Profiling
E-BEAM E-Beam Evaporation
Litho E-Beam Lithography
ECV  

Electrochemical Capacitance Voltage Profiling

 

E-CELL Effusion Cell Evaporation
EXAFS Extended X-ray Absorption
Fine Structure Spectroscopy
  Fermi Surface Mapping
FIB Focused Ion Beam
GC/MS-LC/MS Gas/Liquid Chromatography /
Mass Spectrometry

HR-XRD High Resolution
X-Ray Diffraction

HR-XRD
in Fab
High-Resolution
X-ray Diffraction
in Fab
IBAD Ion Beam Assisted Deposition
ISS Ion Scattering Spectroscopy
KPM Kelvin Probe Microscopy
  LockIn Amplification
LEED
LEED Low Energy Electron Diffraction
LEEM Low Energy Electron Microscopy
LT-STM Low Temperature
Scanning Tunneling Microscopy
MM Magnetic Microscopy
   

Magnetron Sputtering

 

MOCVD  

Metal Organic
Chemical Vapor Deposition

 

MO-MBE Metal Organic Molecular Beam Epitaxy
MBE Molecular Beam Epitaxy
X-Ray Monochromator
M-XPS Monochromatic X-Ray Photoelectron Spectroscopy
RTA Rapid Thermal Annealing
RBS Rutherford Backscattering Spectroscopy
SPECS NanoScience
  Optics
OLED Organic Layer Deposition
PEEM Photo Electron Emission Microscopy
PLD System
PLD Pulsed Laser Deposition
PVD Physical Vapour Deposition
QCM Quartz Crystal Microbalance
RF Radio Frequency Technology
RHEED Reflection High-Energy Electron Diffraction
RGA Residual Gas Analysis
  Robotics
  Sample Preparation
  Sample Manipulation
Scanning Auger
SAM Scanning Auger Microscopy
SKPM Scanning Kelvin Probe Microscopy
SNOM Scanning Near Field Microscopy
SPS Scanning Probe Spectroscopy
SEM Secondary Electron Microscopy
SIMS Secondary lon Mass Spectroscopy
MOTT Spin Polarization Detection
SPIN SPINTRONICS
  Sputtering
STM Scanning Tunneling Microscopy
  Synchrotron Components, Beam Lines, Monochromators
TPD Temperature-Programmed Desorption
K-CELL Thermal Evaporation
TOF-SIMS Time Of Flight - Secondary Ion Mass Spectroscopy
UHV UHV Technology
UPS Ultraviolet Photoelectron Spectroscopy
  VIDEO-LEED
  VIDEO-RHEED

ViewPort Wobble ViewPort
XPD
XPD X-Ray Photoelectron Diffraction
 

XPS

 

X-Ray Photoelectron Spectroscopy

XRF
in Fab
X-Ray Fluorescence
in Fab

XRR X-Ray Reflectivity
 

XPS

 

X-Ray Photoelectron Spectroscopy

 


C4 Scientific Systems
754 Leona Ln
Mountain View, California 94040, USA
Phone: (650) 961-6620
Fax: (650) 961-8591
support@c4scientific.com