Scientific

New ELMITEC Electrostatic Flange-On LEEM with Magnetic Beam Splitter

The ELMITEC LEEM IV Features and Specifications:

• Low Cost
• Ease of use
• Full magnitec shielding
• LEEM/LEED and PEEM modes computer controlled
• Resolution < 20 nm
• Field of view in LEEM mode 3-75 µm
• Field of view in PEEM mode 3-85 µm

Videos of ultimate atomic performance can be made visible through observing nanometer scale processes on surfaces in real-time.

ELMITEC LEEM IV Options:

• Sample Manipulator
• LN sample cooling
• Preparation Chamber
• Vacuum System

ELMITEC LEEM IV Sample Images :

LEEMchen Pb layer on W(110) surface, FOV: 10µm, 7 eV	LEEMchen Pb layer on W(110) surface, FOV: 10µm, 7 eV	LEEMchen Pb layer on W(110) surface, FOV: 10µm, 7 eV	LEEMchen Pb layer on W(110) surface, FOV: 10µm, 7 eV